Iris Publishers - Global Journal of Engineering Sciences (GJES)
Authored by Nguyen Van Hung
This work studies temperature-dependence
of Debye-Waller factors of semiconductors presented in terms of cumulant
expansion in extended X-ray absorption fine structure (EXAFS). The advances in
these studies are succeeded based on further development of the anharmonic
correlated Einstein model derived primary for fcc crystals into the one for
applying to semiconductors and for creating a method having the advantage that
all considered quantities are provided based on only the calculation or
measurement of second cumulants. Analytical expressions of three first EXAFS
cumulants have been derived. They describe the thermodynamic and anharmonic
properties and contribute to accurate structural determination of
semiconductors. The theory simplifies the many-body task into the one of
one-dimensional model with taking the many-body effects into account based on
the first shell near neighbor contributions to the vibration between absorber
and backscattered atoms. Morse potential is assumed to describe single-pair
atomic interaction. The results calculated using the present theory and those
obtained by the created method for Ge having diamond structure are found to be
in good agreement with experiment and with those of other theorie.
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